Comparison of ICP-OES and ICP-MS Techniques for Trace Elemental Analysis in High Matrix Samples
Sunday, March 8, 2026 3:40 PM to 4:00 PM · 20 min. (America/Chicago)
Room 302A
Organized
Instrumentation & Nanoscience
Information
Trace elemental analysis in complex matrices such as brines and industrial effluents presents significant analytical challenges due to matrix interferences, detection limit requirements, and sample throughput constraints. The analysis of high salt samples is of particular interest for a variety of use cases, as removing sample dilution steps improves overall detection limits, decreases sample preparation time, and minimizes preparation error. SPECTRO Analytical Instruments is well known for providing exemplary elemental analysis solutions for a broad range of applications. ICP-OES demonstrates robust matrix tolerance and provides high dynamic range and speed, applying simultaneous multi-element detection. SPECTRO’s three ICP-OES models – the SPECTRO GENESIS, SPECTROGREEN, and SPECTRO ARCOS – offer superior performance for high matrix samples such as oilfield brines. The robust solid-state LDMOS plasma generator provides excellent stability even in the case of very high total dissolved solids and rapidly changing sample loads. The innovative dual side-on plasma interface affords improved sensitivity without adding costly and time-consuming maintenance. The use of CMOS line-array detectors eliminates blooming, enabling the sensitive and precise quantification of trace analytes even in the presence of intense matrix lines. For applications requiring higher sensitivity, such as the analysis of trace elements in seawater, the new SPECTROGREEN MS delivers stability, matrix compatibility, speed, and ease of use. With the same high-powered LDMOS generator employed in SPECTRO’s ICP-OES products and a gas dilution system, the SPECTROGREEN MS is well suited to higher matrix samples such as seawater, and an efficient collision/reaction cell removes polyatomic interferences (such as those induced by the presence of chloride) for superior detection limits.
Day of Week
Sunday
Session or Presentation
Presentation
Session Number
OC-29-04
Application
Instrumentation
Methodology
Ionization Techniques
Primary Focus
Application
Morning or Afternoon
Afternoon
Register
No Registered for Pittcon? Register Now!
