WEVEWEVE develops advanced inspection systems for Micro LED manufacturing, combining AOI, photoluminescence (PL), and colorimetric measurement (x, y, Y) in a single inspection process. Our systems support inspection across multiple production stages, including Epi wafer, CoW, CoC, and panel, with simultaneous RGB inspection capability.
WEVE focuses on fast, high-resolution inspection of Micro LED defects, wavelength uniformity, brightness, and color characteristics, helping manufacturers improve yield and process control throughout the production flow.
