SENTECH SE 400adv PV Laser Ellipsometer for Photovoltaic Applications

The multi-angle laser ellipsometer SE 400adv PV provides film thickness and refractive index of antireflective single films on textured monocrystalline and multicrystalline silicon wafers at the HeNe laser wavelength of 632.8 nm. Exchangeable wafer holders allow for measurements on multicrystalline wafers and alkaline textured monocrystalline wafers. Key benefits: Currently over 510 SENTECH SE 400adv PV multi-angle laser ellipsometers are in use to characterise anti-reflective coatings all over the world. High sensitivity and ultra-low noise detection allow for measuring on non-ideal, stray light causing surfaces typical for textured mono- and multicrystalline silicon solar cells. Extraordinary high stability and accuracy are main features of SENTECH SE 400adv PV laser ellipsometer due to stable laser light source, temperature stabilised compensator setup, and ultra low noise detector.