The Bandi Series is WEVE’s industrial product lineup dedicated to Micro LED inspection. Designed to support the full Micro LED manufacturing flow, Bandi systems provide advanced optical, structural, and colorimetric inspection for Epi wafers, CoW wafers, CoC substrates, and Micro LED panels.
By integrating AOI, PL, and colorimetric (xyY) inspection simultaneously in a single scan, the Bandi Series delivers comprehensive inspection without requiring separate measurement processes. For example, a CoC wafer containing approximately 9 million RGB Micro LED chips can be fully inspected in less than 10 minutes, demonstrating the system’s high throughput for large-scale Micro LED manufacturing.
Combining multi-modal inspection, high throughput, and operational flexibility, the Bandi Series enables accurate evaluation of Micro LED quality and performance across research, pilot, and production environments, and is trusted by leading manufacturers in the industry.
