SENTECH RM 1000 and RM 2000 Spectroscopic Reflectometry Tools

The RM 1000 and RM 2000 spectroscopic reflectometers measure the reflectance of flat or curved samples with smooth or rough surfaces. The thickness, extinction coefficient, and refractive index of single films or layer stacks are calculated using the SENTECH FTPadv Expert software. Single films between 2 nm and 50 µm thickness (RM 2000) or 100 µm (RM 1000), respectively, layer stacks, and substrates can be analysed in the UV‑VIS‑NIR spectral range.